Language : 中文
余彬
34
  • Personal Information

    Gender:Male
    Education Level:With Certificate of Graduation for Doctorate Study
    Degree:Doctoral Degree in Engineering
    School/Department:自动化学院
    Date of Employment:2021-09-06
    Administrative Position:讲师
    Business Address:自动化学院学科3号楼N505
    Contact Information:13236568766; yubin@nuist.edu.cn
    Alma Mater:南京航空航天大学
    Discipline:
    Power Electronics and Transmission
  • Profile

    余彬, , 博士。20216月毕业于南京航空航天大学获电力电子与电力传动工学博士学位, 同年9月入职南京信息工程大学。20233月开始在浙江大学开展博士后研究, 合作导师李武华教授。主要研究方向为固态断路器(固态功率控制器)与固态保护技术、功率半导体器件可靠性与电力电子应用、高效高功率密度换热器优化设计与数值模拟。目前主持有中国博士后科学基金、江苏省自然科学基金、江苏省高等学校自然科学研究面上项目、江苏省智能电网技术与装备重点实验室开放基金、电子制造与封装集成湖北省重点实验室开放基金等基金项目。已在高水平SCI期刊 (IEEE Trans. Power Electron., IEEE J. Emerg. Sel. Topics Power Electron.)及知名学术会议上发表论文10余篇, 申请及授权国家发明专利10余项。

    科研项目:

    [1]    中国博士后科学基金(2023M742981, 2023.12~2025.11), 在研, 主持

    [2]    江苏省基础研究计划自然科学基金-青年基金(BK20230424, 2023.7~2026.6),在研, 主持

    [3]    江苏省高等学校自然科学研究面上项目(23KJB470032, 2023.7-2025.6),在研,主持

    [4]    江苏省智能电网技术与装备重点实验室开放基金(2024.1~2024.12),结题,主持

    [5]    电子制造与封装集成湖北省重点实验室开放基金项目(2024.1~2024.12),结题,主持

    [6]  南京信息工程大学引进人才科研启动项目(2022.4~2024.12), 结题, 主持。

    代表性成果:

    学术论文:

    [1]   Bin Yu, Li Wang and Daniyal Ahmed. Drain–Source Voltage Clamp Circuit for Online Accurate ON-State Resistance Measurement of SiC MOSFETs in DC Solid-State Power Controller[J]. IEEE Journal of Emerging and Selected Topics in Power Electronics, vol. 8, no. 1, pp. 331-342, March 2020. (SCI二区, Top期刊

     

    [2]    Bin Yu, Li Wang. Online Accurate Measurement of Steady-Thermal Resistance of SiC MOSFETs for DC Solid-State Power Controller[J]. IEEE Transactions on Power Electronics, vol. 36, no. 5, pp. 5006-5021, May 2021. (SCI一区, Top期刊


    [3]  Bin Yu, Li Wang . Real-time Extraction of SiC MOSFETs’ Degradation Features under Improved Accelerated Power Cycling Tests for DC-SSPC Application[J]. IEEE Transactions on Power Electronics, May 2023, 38(5): 6489-6503.(SCI一区, Top期刊)


    [4] Bin Yu, Li Wang. Online Short-Term Aging Status Prediction of SiC MOSFETs for DC Solid-State Power Controller Using Adaptive Variable Time-Steps Metabolic Gray Model[J], IEEE Transactions on Power Electronics, vol. 39, no. 10, pp. 12456-12469, Oct. 2024.(SCI一区,Top期刊)


    [5] Bin Yu, Xingjian Shi, Ze Zhou, Enyao Xiang, Hongyi Gao, Haoze Luo, Wuhua Li. Case Temperature Waveform Similarity-Based Online Aging Monitoring for SiC MOSFETs of Accelerated Power Cycling Tests for DC-SSPCs[J], IEEE Journal of Emerging and Selected Topics in Power Electronics, vol. 13, no. 1, pp. 380-393, Feb. 2025.(SCI二区, Top期刊)


    [6] Bin Yu, Xingjian Shi, Hongyi Gao, Haoze Luo, Wenbo Wang,  Francesco Iannuzzo, Wuhua Li. Stress comparison of several short-circuit types on SiC MOSFET packaging[C]//35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2024), Parma, Italy, 2024.


    [7]Xingjian Shi, Bin Yu, Qiang Wu, Dong Hai, Haoze Luo, Wuhua Li, Xiangning He. Thermal Network Modeling of Heat Dissipation Structure of Power Devices with PCM to Enhancing Short-Term Overload Capacity[C]// 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), Chengdu, China, 2024, pp. 3759-3764.


    [8] Hongyi Gao, Dong Hai, Fujun Zheng, Bin Yu, Yuhang Yang, Yuanye Xia, Haoze Luo, Wuhua Li, Xiangning He. Analysis and Experimental Evaluation of Short-Circuit Energy Variation with Split Inductance[C]// 2024 IEEE Energy Conversion Congress and Exposition (ECCE), Phoenix, AZ, USA, 2024, pp. 6871-6877.


    [9] Letian Xiang, Hao Huang, Dong Hai, Shengjie Luo, Bin Yu, Haoze Luo, Wuhua Li. An Online On-State Voltage Measurement Circuit Based on Series Expansion of Depletion MOSFET[C]// 2024 CPSS & IEEE International Symposium on Energy Storage and Conversion (ISESC), Xi'an, China, 2024, pp. 697-701.


    [10] Shuoyu Ye, Yutin Jin, Bin Yu, Yu Chen, Haoze Luo, Chushan Li, Wuhua Li, Xiangning He. Junction Temperature and Current Perception of Silicon Thyristor Based on Electroluminescence Spectrum[C]//2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), Chengdu, China, 2024, pp. 2265-2270.


    [11] 余彬,王莉,阮立刚.Y电容引起的手机充电器漏电研究[J]. 电源学报, 2019,17(01):128-135.  (高质量T3级期刊).


    [12] 奕丽芳,王莉,黄瑞,钱叶彤,余彬.多路独立输出隔离直流电源的故障保护研究[J]. 电源学报, 2021, 19(05): 200-207.  (高质量T3级期刊).


    发明专利:

    [1]    一种功率器件老化测试用纯硬件实现控制电路及控制方法[P]. 中国: ZL20221129584.2, 2023-09-22.(授权)


    [2]   直流固态断路器的功率管老化测试装置及其测试方法[P] . 中国: ZL202211219636.6, 2023-12-01.(授权)


    [3]  碳化硅功率器件的焊料层失效状态在线原位表征系统及方法[P]. 中国: ZL202211093704.9, 2023-12-01.(授权)


    [4]   直流固态功率控制器的功率管导通电压的在线测量电路[P]. 中国: ZL202211093704.9, 2021-09-28.(授权)


    [5]   控制电路及监测系统[P]. 中国: 2023116460983, 2023-12-01.(公开)


    [6]    一种基于壳温的功率器件老化状态原位监测系统[P]. 中国: 2024100867744, 2024-01-22.(公开)

    学生指导:

    [1] 2024年, 南京信息工程大学优秀本科毕业设计二等奖(学生:曹尚)

    [2] 2024, 南京信息工程大学优秀本科毕业设计二等奖(学生:闫旭东)

    [3] 2023, 南京信息工程大学优秀本科毕业设计二等奖(学生:李加龙)

    [4] 陈旷达等, 2022年大学生创新创业训练计划项目, 结题

    [5] 闫旭东等, 2022年大学生创新创业训练计划项目, 结题

    [6] 2024, 南京信息工程大学 “优秀班主任”

    [7] 2023, 南京信息工程大学 “优秀班主任”

    研究生招生:

    招生专业:电子信息、控制工程

    硕士生:1~3人/年


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