Yan Leiming; Chen Kai; Tong Shikun; Jinwei Wang*; Zhen Chen; Identifying forged seal imprints using positive and unlabeled learning
Hits:
|
|
Yan Leiming; Chen Kai; Tong Shikun; Jinwei Wang*; Zhen Chen; Identifying forged seal imprints using positive and unlabeled learning
Hits:
|
|
| Copyright©2019 Nanjing University of Information Science and Technology·Network Information Center |
Click:
 MOBILE Version
The Last Update Time:.. |
